Reliability assessment considering stress drift and shock damage caused by stress transition shocks in a dynamic environment

doi:10.21629/JSEE.2019.05.18

Journal of Systems Engineering and Electronics ›› 2019, Vol. 30 ›› Issue (5): 1025-1034.doi: 10.21629/JSEE.2019.05.18

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Reliability assessment considering stress drift and shock damage caused by stress transition shocks in a dynamic environment

Tingting HUANG(), Bo PENG*(), Yuepu ZHAO(), Zixuan YU()

School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China

Received:2018-07-03 Online:2019-10-08 Published:2019-10-09
Contact: Bo PENG E-mail:htt@buaa.edu.cn;pengb@buaa.edu.cn;zhao@buaa.edu.cn;yuzixx@buaa.edu.cn
About author:HUANG Tingting was born in 1981. She is an assistant professor for the School of Reliability and Systems Engineering, Beihang University, China. She worked as a postdoctoral for the Department of Industrial Engineering, Tsinghua University in 2011. She recieved her Ph.D. degree from the School of Reliability and Systems Engineering, Beihang University in 2010. She recieved her M.S. degree from the Department of Industrial and Systems Engineering, Virginia Tech in 2014. She was a visiting scholar in the Department of Industrial and Systems Engineering, Rutgers University, USA in 2008. Her research interests are accelerated life testing, accelerated degradation testing and other reliability and environment testing technology. Her recent work is on degradation modeling and reliability prediction of products in a dynamic environment considering shocks. E-mail: htt@buaa.edu.cn|PENG Bo was born in 1986. He is currently working towards his Ph.D. degree in the School of Reliability and Systems Engineering, Beihang University. His research interests are degradation modeling and lifetime prediction for degradation tests. E-mail: pengb@buaa.edu.cn|ZHAO Yuepu was born in 1996. He is currently working towards his Ph.D. degree in the School of Reliability and Systems Engineering, Beihang University. His research interests are degradation modeling and lifetime prediction for degradation tests. E-mail: yuepu zhao@buaa.edu.cn|YU Zixuan was born in 1993. She is currently working towards her Ph.D. degree in the School of Reliability and Systems Engineering, Beihang University. Her research interests are multivariable degradation modeling and lifetime prediction. E-mail: yuzixx@buaa.edu.cn
Supported by:
the National Natural Science Foundation of China(NSFC71601009);the Technical Foundation Program from the Ministry of Industry and Information Technology of China(JSZL2015601B010);This work was supported by the National Natural Science Foundation of China (NSFC71601009) and the Technical Foundation Program from the Ministry of Industry and Information Technology of China (JSZL2015601B010)

Abstract

Abstract:

Products are often subject to dynamic environmental conditions in field use. When stress transition occurs, products may be exposed to instantaneous shocks that result in shock damages to the products, causing a permanent change of the degradation signals. Meanwhile, under some conditions, instantaneous shocks also lead to stress drift, causing a temporary change of the degradation signals. In this paper, a degradation model is proposed to assess the reliability and predict the residual lifetime of products operating in a dynamic environment considering shock damage and stress drift. The model is established based on a Wiener process which combines a stress-dependent degradation rate function, a shock damage function and a stress drift function in response to the dynamic environment. The shock damage function is established as a linear function of the stress transition start level and the stress level increment. The stress drift function is established as the difference value of a specified function at the stress transition start and end levels. A simulation study is presented to demonstrate the application of the model, and a case study for miniature light bulbs is used to validate the effectiveness of the proposed model.

Key words: degradation modeling, dynamic environment, stress drift, shock damage, Wiener process

Tingting HUANG, Bo PENG, Yuepu ZHAO, Zixuan YU. Reliability assessment considering stress drift and shock damage caused by stress transition shocks in a dynamic environment[J]. Journal of Systems Engineering and Electronics, 2019, 30(5): 1025-1034.

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$\alpha $	$\beta $	$\gamma $	$\lambda $	$a$	$b$	$\sigma $	$D$
9	3	3	2.5	0.1	1.5	2.8	2 000

$\alpha $	$\beta $	$\gamma $	$\lambda $	$a$	$b$	$\sigma $
8.86	2.98	2.93	2.56	0.098	1.491	2.73

Method	$\alpha $	$\beta $	$\gamma $	$\lambda $	$a$	$b$	$\sigma $
Bias	0.002 2	-0.006 5	0.005 5	0.003 6	-0.003 3	0.002 4	0.004 1
SD	0.026 5	0.042 3	0.058 8	0.046 7	0.032 2	0.045 5	0.032 2
RMSE	0.029 9	0.044 2	0.062 6	0.045 2	0.028 7	0.042 1	0.035 1

$\alpha $	$\beta $	$\gamma $	$\lambda $	$a$	$b$	$\sigma $
0.003 43	0.000 06	0.512	0.048	2.67$\times $10$^{ - 5}$	1.98	0.2$\times $10$^{ - 4}$

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Reliability assessment considering stress drift and shock damage caused by stress transition shocks in a dynamic environment

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