Bayesian optimal design of step stress accelerated degradation testing
Xiaoyang Li1,*, Mohammad Rezvanizaniani2, Zhengzheng Ge3,Mohamed Abuali2 and Jay Lee2
1. Science and Technology on Reliability and Environmental Engineering Laboratory, Beihang University, Beijing 100191, China;
2. NSF Industry/University Cooperative Research Center on Intelligent Maintenance Systems, University of Cincinnati, OH 45221, USA;
3. Beijing Institute of Electronic System Engineering, Beijng 100854, China
Xiaoyang Li, Mohammad Rezvanizaniani, Zhengzheng Ge, Mohamed Abuali and Jay Lee. Bayesian optimal design of step stress accelerated degradation testing[J]. Systems Engineering and Electronics, doi: 10.1109/JSEE.2015.00058.