Journal of Systems Engineering and Electronics ›› 2010, Vol. 21 ›› Issue (4): 566-571.doi: 10.3969/j.issn.1004-4132.2010.04.007
• DEFENCE ELECTRONICS TECHNOLOGY • Previous Articles Next Articles
Yanwei Zhao1, Ping Zhou2, Xiangyang Zhang2, and Min Zhang1,*
1. School of Science, Xidian University, Xi’an 710071, P. R. China;
2. National Electromagnetic Scattering Laboratory, Beijing 100854, P. R. China